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Image Metrology


advanced software for microscopy, calibration, measurements and 3D visualization

Zurich  8093
Switzerland

tel: +41 41 044 633 29 22

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Atomic Force Microscopes (AFM) 
Confocal Microscopes 
Electron Microscopes 
Hard Disk Arrays 
High Pass Filters 
Image Analyzers 
Interface Plug In Relays 
Publications 
Scanning Electron Microscopes (SEM) 
Scanning Probe Microscopes 
Test and Measurement Instrumentation 

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News and Blogs

Meet us at MRS Fall Meeting 2009

Free Webinar on Particle & Pore Analysis

Revision History

SPIP™ Update: v. 5.0.3 Released

 

Press Releases

Meet us at MRS Fall Meeting 2009

Free Webinar on Particle & Pore Analysis

Revision History

SPIP™ Update: v. 5.0.3 Released

 

Web Results

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Image Metrology - Companies - nanotechweb.org

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